Federal (United States) · Regulations
Subpart A — Semiconductor Subcategory
10 sections
10 sections
- 40 C.F.R. § 469.10Applicability.
- 40 C.F.R. § 469.11Compliance dates.
- 40 C.F.R. § 469.12Specialized definitions.
- 40 C.F.R. § 469.13Monitoring.
- 40 C.F.R. § 469.14Effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available (BPT).
- 40 C.F.R. § 469.15Effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically achievable (BAT).
- 40 C.F.R. § 469.16Pretreatment standards for existing sources (PSES).
- 40 C.F.R. § 469.17New source performance standards (NSPS).
- 40 C.F.R. § 469.18Pretreatment standards for new sources (PSNS).
- 40 C.F.R. § 469.19Effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollution control technology (BCT).