15 MAC Pt. 21, R. 1.8.2
Definitions
Cite as 15 Miss. Admin. Code Pt. 21, R. 1.8.2
Definitions. As used in this section, the following definitions apply:
1. "Analytical x-ray equipment" means equipment used for x-ray diffraction
or fluorescence analysis.
2. "Analytical x-ray system" means a group of components utilizing x-
or gamma-rays to determine the elemental composition or to examine
the microstructure of materials.
3. "Fail-safe characteristics" mean a design feature which causes beam port
shutters to close, or otherwise prevents emergence of the primary
beam, upon the failure of a safety or warning device.
4. "Local components" mean part of an analytical x-ray system and
include areas that are struck by x-rays such as radiation source
housings, port and shutter assemblies, collimators, sample holders,
cameras, goniometers, detectors, and shielding, but do not include
power supplies, transformers, amplifiers, readout devices, and control
panels.
5. "Normal operating procedures" mean step-by-step instructions necessary
to accomplish the analysis. These procedures shall include sample
insertion
and
manipulation,
equipment
alignment,
routine
maintenance by the registrant, and data recording procedures, which
are related to radiation safety.
6. "Open-beam configuration" means an analytical x-ray system in which an
individual could accidentally place some part of his body in the
primary beam path during normal operation.
7. "Primary beam" means radiation which passes through an aperture of
the source housing by a direct path from the x-ray tube or a
radioactive source located in the radiation source housing.