Definitions

As used in this chapter, the following definitions apply: 1. "Analytical x-ray equipment" means equipment used for x-ray diffraction or fluorescence analysis. 2. "Analytical x-ray system" means a group of components utilizing x-rays or gamma rays to determine the elemental composition or to examine the microstructure of materials. 3. "Fail-safe characteristics" means a design feature which causes beam port shutters to close, or otherwise prevents emergence of the primary beam, upon the failure of a safety or warning device. 4. "Local components" means part of an analytical x-ray system and includes areas that are struck by x-rays, such as radiation source housings, port and shutter assemblies, collimators, sample holders, cameras, goniometers, detectors and shielding, but do not include power supplies, transformers, amplifiers, readout devices, and control panels. 5. "Normal operating procedures" means step-by-step instructions necessary to accomplish the analysis. These procedures must include sample insertion and manipulation, equipment alignment, routine maintenance by the registrant, and data recording procedures, which are related to radiation safety. 6. "Open-beam configuration" means an analytical x-ray system in which an individual could accidentally place some part of the individual's body in the primary beam path during normal operation. 7. "Primary beam" means ionizing radiation which passes through an aperture of the source housing by a direct path from the x-ray tube or a radioactive source located in the radiation source housing.