40 C.F.R. Table I-17 to Subpart I of Part 98

Expected and Possible By-Products for Electronics Manufacturing

Last amended: 2024Year: 2026Length: 209 wordsOfficial source

Cite as 40 C.F.R. Table I-17 to Subpart I of Part 98 (2026)

For each stack system for which you use the “stack test method” to calculate annual emissions, you must measure the following: If emissions are detected intermittently, use the following procedures: If emissions are not detected, use the following procedures: Expected By-products: CF 4 C 2 F 6 CHF 3 CH 2 F 2 CH 3 F Use the measured concentration for “X ksm ” in Equation I-18 when available and use one-half of the field detection limit you determined for the fluorinated GHG according to § 98.94(j)(2) for the value of “X ksm ” when the fluorinated GHG is not detected Use one-half of the field detection limit you determined for the fluorinated GHG according to § 98.94(j)(2) for the value of “X ksm ” in Equation I-18. Possible By-products: C 3 F 8 C 4 F 6 c-C 4 F 8 C 5 F 8 Use the measured concentration for “X ksm ” in Equation I-18 when available and use one-half of the field detection limit you determined for the fluorinated GHG according to § 98.94(j)(2) for the value of “X ksm ” when the fluorinated GHG is not detected Assume zero emissions for that fluorinated GHG for the tested stack system. [78 FR 68234, Nov. 13, 2013]
Cross-references to the CFR
98.94
40 C.F.R. Table I-17 to Subpart I of Part 98: Expected and Possible By-Products for Electronics Manufacturing | Justis AI